- All sections
- G - Physics
- G03F - Photomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devices; materials therefor; originals therefor; apparatus specially adapted therefor
- G03F 1/44 - Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
Patent holdings for IPC class G03F 1/44
Total number of patents in this class: 201
10-year publication summary
|
15
|
15
|
22
|
22
|
20
|
14
|
18
|
15
|
17
|
10
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 6816 |
33 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 36809 |
29 |
| KLA-Tencor Corporation | 2574 |
18 |
| Samsung Electronics Co., Ltd. | 131630 |
9 |
| Boe Technology Group Co., Ltd. | 35384 |
9 |
| D2s, Inc. | 150 |
6 |
| Nikon Corporation | 7162 |
5 |
| Hoya Corporation | 2822 |
5 |
| Synopsys, Inc. | 2829 |
5 |
| Carl Zeiss SMT GmbH | 2646 |
5 |
| International Business Machines Corporation | 60644 |
4 |
| Ordos Yuansheng Optoelectronics Co., Ltd. | 1232 |
4 |
| Changxin Memory Technologies, Inc. | 4732 |
4 |
| KLA Corporation | 1223 |
4 |
| Dai Nippon Printing Co., Ltd. | 3891 |
3 |
| Shenzhen China Star Optoelectronics Technology Co., Ltd. | 8635 |
3 |
| Beijing BOE Optoelectronics Technology Co., Ltd. | 3779 |
3 |
| Shanghai Huali Microelectronics Corporation | 160 |
3 |
| Kioxia Corporation | 9847 |
3 |
| Micron Technology, Inc. | 24960 |
2 |
| Other owners | 44 |